Abstract
Er-doped SnO 2 thin films and xerogels are obtained by sol-gel technique. In order to understand the Er 3+ rare-earth ion activity in SnO 2 matrix, a characterization of Er incorporation is done through emission and excitation spectra of xerogels, besides thin film electrical characterization. Effects to grain dimensions are also analyzed based on X-ray diffraction data showing the particle growth with annealing temperature and inhibition of this growth by Er doping. Electrical characterization results suggest that Er 3+ has an acceptor-like character in SnO 2 , and that codoping with Yb 3+ allows an energy transfer process Yb 3+ → Er 3+ .
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CITATION STYLE
Morais, E. A., Scalvi, L. V. de A., Geraldo, V., Ribeiro, S. J. L., & Santilli, C. V. (2003). Er rare-earth ion incorporation in sol-gel SnO2. Materials Research, 6(4), 445–449. https://doi.org/10.1590/s1516-14392003000400003
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