The effect of CuO thickness to perovskite photodetector performance synthesized at ambient temperature

Abstract

Perovskite photodetectors are promising optoelectronic material for numerous applications. In this study, we used TiO2 as the active material for a detector of visible light combining with perovskite CH3NH3PbI3 and CuO. The thickness of the CuO layer was varied in the number of coatings of 1 to 4 times by spin-coating technique. The samples were characterized using XRD, SEM, photodetector and solar simulators test. The XRD results show CuO and perovskite peaks with the crystal structure of monoclinic and tetragonal. The morphology of CuO films is a sphere, the particles are agglomerated, and the grain boundary is unclear. More general results are CuO thickness obtained around 1-9 μm, samples with 2 times of coating CuO showed good result in the photodetector test.