Electron-ion-ion triple-coincidence spectroscopic study of site-specific fragmentation caused by Si:2p core-level photoionization of F3 SiCH2 CH2 Si (CH3) 3 vapor

Abstract

Site-specific fragmentation caused by Si:2p core-level photoionization of F3 SiCH2 CH2 Si (CH3) 3 vapor was studied by means of high-resolution energy-selected-electron photoion-photoion triple-coincidence spectroscopy. The ab initio molecular orbital method was used for the theoretical description. F3 SiCH2 CH2 + - Si (CH3) 3 + ion pairs were produced by the 2p photoionization of the Si atoms bonded to the three methyl groups, and SiF+ -containing ion pairs were produced by the 2p photoionization of the Si atoms bonded to the three F atoms. © 2007 The American Physical Society.