Journal ArticleOPEN ACCESS

Aberration-Corrected STEM Imaging and Spectroscopy of Single-Layered Materials

  • Chisholm M
  • Duscher G
  • Windl W
Microscopy and Microanalysis (2011) 17(S2) 1260-1261
DOI: 10.1017/s1431927611007173
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Abstract

Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

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Chisholm, M., Duscher, G., & Windl, W. (2011). Aberration-Corrected STEM Imaging and Spectroscopy of Single-Layered Materials. Microscopy and Microanalysis, 17(S2), 1260–1261. https://doi.org/10.1017/s1431927611007173

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