Abstract
Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.
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CITATION STYLE
APA
Chisholm, M., Duscher, G., & Windl, W. (2011). Aberration-Corrected STEM Imaging and Spectroscopy of Single-Layered Materials. Microscopy and Microanalysis, 17(S2), 1260–1261. https://doi.org/10.1017/s1431927611007173
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