Abstract
Silver doped CdS0.2Se0.8 thin films of different concentrations were grown by simple and economical chemical bath deposition technique and later on characterized for optoelectronic and physicochemical properties. The X-ray diffraction (XRD) patterns of undoped and doped sample indicates polycrystalline nature with hexagonal structure. Scanning electron microscopy (SEM) micrograph showed uniform morphology with cabbage type structure for undoped film and leaf-like structure for doped films over the entire glass substrate. Room temperature absorbance for 1 wt% doping concentration of silver showed an excitonic peak which confirms the size quantization of the particle. I-V characteristic for undoped and doped film shows ohmic and Schottky junction behavior. © 2012 American Institute of Physics.
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Chaudhari, J. B., Patil, R. S., Patil, I. J., Jagtap, P. P., & Sharma, R. (2012). Studies on structural & optical properties of CdS0.2Se 0.8: Ag nanocomposite thin film for photosensor application. In AIP Conference Proceedings (Vol. 1447, pp. 697–698). https://doi.org/10.1063/1.4710194
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