Selected area XPS analysis for identification of pigment compounds in microscopic paint flakes

Abstract

The application of X-ray photoelectron spectroscopy to the analysis of paint flakes from a painting by Henry Fuseli (1741-1825) is presented. Historically, the application of XPS to art conservation and restoration studies has been limited by the poor spatial resolution of the technique. Presented here is the successful analysis of paint flakes in the order of 100 μm using "imaging" XPS in conjunction with selected area analysis. Raman microscopy failed to satisfactorily identify the compounds present in this instance, and energy dispersive spectroscopy could not differentiate between lead and sulphur (two of the elements of interest) due to the limited energy resolution inherent in that technique. Using XPS analysis of the lead 4f peak revealed that the pigment was a lead-based pigment, in this case comprising exclusively lead-sulphur compounds. Copyrigth © 2008 Bryony Joanne James et al.