Origin of difference in photocatalytic activity of ZnO (002) grown on a- and c-face sapphire

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Abstract

The oriented (002) ZnO films were grown on a- and c-face sapphire by pulsed laser deposition. The X-ray diffraction analysis revealed that the oriented (002) ZnO films were epitaxially grown on the substrate successfully. The sample on a-face sapphire had higher crystal quality. However, the photocatalytic activity for Rhodamine B degradation of ZnO film on c-face sapphire was higher than that on a-face sapphire. The Raman spectrum and XPS analysis suggested that the sample on a-face sapphire had higher concentration of defects. The result of the contact angle measurement revealed that the sample on c-face sapphire had higher surface energy. And the investigation of the surface conductance implied that the higher light conductance was helpful for the photocatalytic activity. © 2014 Guoqiang Li et al.

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Li, G., Sun, B., Wang, Y., Wu, Z., & Zhang, W. (2014). Origin of difference in photocatalytic activity of ZnO (002) grown on a- and c-face sapphire. International Journal of Photoenergy, 2014. https://doi.org/10.1155/2014/135725

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