ANALYSIS OF HALF VALUE LAYER (HVL), TENTH VALUE LAYER (TVL) AND MEAN FREE PATH (MFP) OF SOME OXIDES IN THE ENERGY RANGE OF 122KeV to 1330KeV

Abstract

In the present work half value layer (HVL), tenth value layer (TVL)and mean free path (Mfp) are the most frequently used important parameter for explaining both the penetrating ability of particular radiations and the penetration through specific objects or material. The half value layers (HVL), tenth value layers (TVL) gives the thickness of a shield or an absorber that reduces the radiation level by a factor of one-half and one tenth of the initial level, respectively. The concepts of HVL and TVL are widely used in shielding design. In the present investigation we calculated the values of linear attenuation coefficient, mean free path (MfP), half value layer (HVL) and tenth value layer (TVL) for some oxides such as aluminum oxide, manganese oxide, copper oxide and magnesium oxide in the energy range from 122keV to 1330keV were measured. The transmitted intensity of photons emitted by radioactive isotopes of 133Ba, 22Na, 137Cs, 54Mn and 60Co measured using the NaI(Tl) scintillation detector and results obtained are in good agreement with the values reported in the present study.