Measurement of dielectric loss tangent at cryogenic temperature using superconducting film resonator

Abstract

We demonstrate that the superconducting film resonator can be used to accurately and quantitatively measure the microwave dielectric loss tangent of a variety of materials. Compared to traditional dielectric resonator loaded metal cavity method, it has advantage of small sample size (~2–3 orders of magnitude smaller than the old method), and much higher sensitivity to measure small loss tangent values as small as 10−5 at around 7 GHz band at cryogenic temperatures. This method can be utilized widely in study of mechanism of microwave loss at cryogenic temperature range, which is extremely important in superconducting microwave application areas, such as novel super quantum computers.