Application of Microtexture Measurements in the SEM to Grain Boundary Parameters

Abstract

This paper discusses how microtexture data, i.e. individual orientations which are measured on a grain and environmentally specific basis, are applied to grain boundary geometrical parameters. Three main areas are addressed: the “interface‐plane” scheme for specifying the five degress of freedom of a boundary, comparisons of experimental techniques for data collection, and representation of grain boundary misorientations in Rodrigues‐Frank space. Particular attention is paid to electron back‐scatter diffraction as a method of probing grain boundary misorientation and the crystallographic orientation of the grain boundary plane.