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Testing System for Analog Devices Direct Digital Synthesizer

MATEC Web of Conferences (2016) 79
DOI: 10.1051/matecconf/20167901015
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Abstract

The paper is devoted to the setup for controlling and testing of Direct Digital Synthesizer (DDS) Integrated Circuits (ICs). Control and measurement setup is designed on the basis of National Instruments module equipment PXI-4110, PXI-7841R and LabVIEW development environment. Block diagram of the developed system and software structure are depicted as well as test results for several ICs.

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APA

Loskutov, I., Shvetsov-Shilovskiy, I., & Boychenko, D. (2016). Testing System for Analog Devices Direct Digital Synthesizer. In MATEC Web of Conferences (Vol. 79). EDP Sciences. https://doi.org/10.1051/matecconf/20167901015

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