The characteristics of microphysical processes of a severe winter storm that occurred on the Korean Peninsula on 12 December 2013 was studied in this work for the first time via X-band dual-polarization weather radar observations. A new range–height indicator (RHI) scan-based quasi-vertical profile methodology, in which polarimetric radar variables were averaged at each height of the RHI scan, was introduced to investigate the snow microphysics, and the obtained polarimetric radar signatures served as fingerprints of the dendritic growth, aggregation, and riming processes. Enhanced differential reflectivity (Zdr) and specific differential phase shift (Kdp) bands were detected near the-15°C isotherm,which signified the growth of dendrites or platelike crystals. The observed correlation between the increases in the reflectivity factor at horizontal polarization Zh and copolar correlation coefficient rhv and the decreases in Zdr and Kdp magnitudes at lower heights suggested the occurrence of the aggregation process. The combination of high Zh and low Zdr values with turbulent atmospheric conditions observed at the ground level indicated the occurrence of the riming process. In addition, the negative Kdp and Zdr values combined with high Zh and rhv magnitudes (observed near the end of the snow event) indicated the formation of graupel particles. The polarimetric radar signatures obtained for the snow growth processes were evident from ground observations and agreed well with the results of the Weather Research and Forecasting Model and Modern-Era Retrospective Analysis for Research and Applications data. Furthermore, the spatial variability of Zh methodology was implemented to describe both aggregates and rimed ice particles.
CITATION STYLE
Allabakash, S., Lim, S., Chandrasekar, V., Min, K. H., Choi, J., & Jang, B. (2019). X-band dual-polarization radar observations of snow growth processes of a severe winter storm: Case of 12 December 2013 in South Korea. Journal of Atmospheric and Oceanic Technology, 36(8), 1217–1235. https://doi.org/10.1175/JTECH-D-18-0076.1
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