Abstract
As part of the efforts to enhance the near-field scanning optical microscopy and the detection of evanescent waves, a silicon Schottky diode, shaped as a truncated trapezoid photodetector and sharing a subwavelength pin-hole aperture, has been designed and simulated. Using finite elements method and two-dimensional advanced simulations, the detector has been horizontally shifted across a vertically oriented Gaussian beam, which is projected on top of the device. Both electrical and electro-optical simulations have been conducted. These results are promising toward the fabrication of a new generation of photodetector devices. (C) The Authors. Published by SPIE under a Creative Commons Attribution 3.0 Unported License.
Cite
CITATION STYLE
Karelits, M., Mandelbaum, Y., Chelly, A., & Karsenty, A. (2018). Laser beam scanning using near-field scanning optical microscopy nanoscale silicon-based photodetector. Journal of Nanophotonics, 12(03), 1. https://doi.org/10.1117/1.jnp.12.036002
Register to see more suggestions
Mendeley helps you to discover research relevant for your work.