Abstract
Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.
Cite
CITATION STYLE
APA
Re, A., Lo Giudice, A., Angelici, D., & Pratesi, G. (2011). SEM-EDX and SEM-CL to Characterize Lapis Lazuli from Different Provenances. Microscopy and Microanalysis, 17(S2), 1806–1807. https://doi.org/10.1017/s1431927611009901
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