Abstract
Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.
Cite
CITATION STYLE
APA
Bonifacio, C., Thron, A., Bersuker, G., & van Benthem, K. (2010). In Situ Investigation of Dielectric Breakdown in Field Effect Transistors. Microscopy and Microanalysis, 16(S2), 1298–1299. https://doi.org/10.1017/s1431927610058666
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