Effect of firing temperature on electrical and structural characteristics of screen printed ZnO thick films

Abstract

ZnO thick films were prepared by using standard screen printing technique and fired at different temperatures in air atmosphere. The DC resistance of the films was measured by half bridge method in air atmosphere at different temperatures. The films were showing decrease in resistance with increase in temperature indicating semiconductor behaviour. The resistivity, activation energy and temperature coefficient of resistance (TCR) are evaluated at different firing temperatures. The structural behaviour, surface morphology and phase composition were studied by XRD, SEM and EDX technique respectively.