Optical properties of silicon pigmented alumina films

Abstract

Plates of Al-Si alloy were anodized in a sulfuric acid solution. This treatment provides a Si-Al2O3 coating growing at a rate of 0.14 μm/min The Si particles had sizes between 1 and 10 μm, as seen by scanning electron microscopy. Optical measurements showed a continuous decrease of reflectance with increasing film thickness. The reflectance of the Si-Al2O3 coated aluminum could be understood from a four flux radiative transfer theory. In order to explain our measurements, it was found necessary to include a free-carrier term in the dielectric permittivity of Si. The free carriers are probably due to doping with Al. Hence, the relaxation time of the free carriers is determined by scattering from the charged Al impurities. © 1997 American Institute of Physics.