Abstract
Among various lead-free alloys. Sn-Ag(-Cu) system solders are considered the most promising lead-free solders for both wave and refiow soldering technology. Moreover, to improve the characteristics of lead-free solders, the effect of the addition of minor elements to lead-free solders on the properties of solder and interfacial reactions have been studied. The purpose of this research was to investigate the addition of Ni or Co to the Sn-Ag solder on the microstructure and the joint strength of the interface with metallization layer of the substrate. As a metallization layer of the substrate, bare Cu and electroless Ni-P plating were used. For the refiow process, test samples were heated in a radiation furnace at 523 K for 60s, and for the aging process, some samples were heat-treated in an oil bath at 423 K for 168 h, 504 h and 1008 h. Results show the addition of Ni or Co was effective for the IMC formation and growth at the interface with a Cu pad during reflow and aging process, and the addition of Co. except Ni. affected the pull strength of the solder joint with electroless Ni-P plating during aging process. © 2008 The Japan Institute of Metals.
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Nishikawa, H., Komatsu, A., & Takemoto, T. (2008). Effect of Ni or Co addition to Sn-Ag solder on microstructure and joint strength at interface. Materials Transactions, 49(7), 1518–1523. https://doi.org/10.2320/matertrans.MF200851
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