A New Approach to Analyze LaMnO3/Y2O3-Stabilized ZrO2 Interface By Secondary Ion Mass Spectrometry

Abstract

Oxygen diffusion and active sites for oxygen incorporation were investigated around the interface of LaMnO(3)-cathode/Y(2)O(3)-stabilized ZrO(2) (YSZ) by using a new analysis technique: secondary ion mass spectrometry (SIMS) analysis for the samples with isotopic oxygen exchange ((16)O/(18)O exchange). Diffusion of (18)O inside the LaMnO(3) film was examined at different cathodic polarizations. At the higher cathodic polarization, (18)O can diffuse through the LaMnO(3) film to reach the interface of LaMnO(3)/YSZ. The distribution of active sites for oxygen incorporation was also investigated on the surface of YSZ after removing the LaMnO3 layer. The active sites for oxygen incorporation were distributed as many spots of high concentration of (18)O around the interface of LaMnO(3) / YSZ.