Comparison of the Detection Limits of EDS and EELS in S/TEM

HS von Harrach; D Klenov; B Freitag; P Schlossmacher; PC Collins; HL Fraser

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Comparison of the Detection Limits of EDS and EELS in S/TEM

von Harrach H
Klenov D
Freitag B
et al.

Microscopy and Microanalysis (2010) 16(S2) 1312-1313

DOI: 10.1017/s1431927610058940

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Abstract

Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

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von Harrach, H., Klenov, D., Freitag, B., Schlossmacher, P., Collins, P., & Fraser, H. (2010). Comparison of the Detection Limits of EDS and EELS in S/TEM. Microscopy and Microanalysis, 16(S2), 1312–1313. https://doi.org/10.1017/s1431927610058940

Comparison of the Detection Limits of EDS and EELS in S/TEM

Abstract

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