Abstract
We have employed TEM techniques to investigate vertical alignment in multilayered In0.33Ga0.67As quantum dots (QDs) as a function of deposition thickness. Our experimental results are discussed in the context of an analytical model reported in the literature, in terms of the so-called pairing probability, which can assess the quality of vertical alignment. © 2010 IOP Publishing Ltd.
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CITATION STYLE
Sridhara Rao, D. V., Muraleedharan, K., Balamuralikrishnan, R., Muralidharan, R., Srinivasan, T., & Banerjee, D. (2010). TEM studies of multilayered In0.33Ga0.67As quantum dots. In Journal of Physics: Conference Series (Vol. 209). Institute of Physics Publishing. https://doi.org/10.1088/1742-6596/209/1/012037
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