Adjustment of thermal hysteresis in epitaxial VO2 films by doping metal ions

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Abstract

Thermal hysteresises of electrical resistance, accompanying with a structural phase transition, in epitaxial VO2 films have been successfully reduced to 1°C or less by doping Ti or Nb ions. We considered that owing to the metal-ion-substitutivestructural defects induced by doping metal ions into VO2 films, the structural phase transition easily occurred without superheating or supercooling. In Nb-doped VO2 films, the hysteresis disappeared at a lower doping level than Ti-doped VO2 films. The maximum values of the temperature coefficient of the resistance of V0.91Ti0.09O2 and V0.982Nb 0.018O2 films, which exhibited non-hysteretic MI transitions, were -24.8%/°C at 46°C and -21.6%/°C at 19°C, respectively. © 2011 The Ceramic Society of Japan.

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Nishikawa, M., Nakajima, T., Kumagai, T., Okutani, T., & Tsuchiya, T. (2011). Adjustment of thermal hysteresis in epitaxial VO2 films by doping metal ions. Journal of the Ceramic Society of Japan, 119(1391), 577–580. https://doi.org/10.2109/jcersj2.119.577

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