Structural analysis and dielectric properties of La1-xBixFeO3 perovskite materials at room temperature

Abstract

Perovskites La1-xBixFeO3 (x = 0.1, 0.3, and 0.5) were prepared by sol-gel method. Structural characterization was performed by X-Ray diffraction (XRD) and X-Ray Fluorescence (XRF). Based on refinement results of XRD analysis, the samples shown the single phase orthorhombic structure with Pnma space group. The dielectric constant and loss factor of the bulk samples were investigated by using LCR-Meter in the frequency range of 100 Hz-1 MHz at room temperature. Increasing Bi content caused decreasing dielectric constant. It may be correlated with decreasing the density of sample with Bi-doped.