Talbot-Lau interferometry-based X-ray imaging system with retractable and rotatable gratings for nondestructive testing

Abstract

We develop an X-ray imaging system based on Talbot-Lau interferometry equipped with a mechanical structure for retracting and rotating gratings from the optical axis, which enables not only X-ray phase contrast imaging but also conventional X-ray imaging with high-magnification such as microcomputed tomography (μCT). We investigate the characterization of carbon fiber reinforced plastic (CFRP) laminates using this apparatus. Microcracks and fiber orientations are visualized in the dark-field images. Compared with the obtained μCT images, the relationship between the CFRP microstructures and the contrasts in the dark-field images are recognizable.