Abstract
We use a single ion as a movable electric field sensor with accuracies on the order of a few V/m. For this, we compensate undesired static electric fields in a planar radio frequency trap and characterize the static field and its curvature over an extended region along the trap axis. We observe a strong buildup of stray charges around the loading region on the trap resulting in an electric field of up to 1.3 kV/m at the ion position. We also find that the profile of the stray field remains constant over a time span of a few months. © 2011 American Institute of Physics.
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CITATION STYLE
Narayanan, S., Daniilidis, N., Möller, S. A., Clark, R., Ziesel, F., Singer, K., … Häffner, H. (2011). Electric field compensation and sensing with a single ion in a planar trap. Journal of Applied Physics, 110(11). https://doi.org/10.1063/1.3665647
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