Exciton-related photoluminescence in homoepitaxial GaN of Ga and N polarities

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Abstract

A photoluminescence (PL) study of GaN homoepitaxial layers grown by metal-organic chemical-vapor deposition demonstrates the high optical quality of N-face layers deposited on vicinal (0001) GaN substrates. In contrast to broad PL emission in exact (0001) layers, narrow-bound (0.9 meV) and free-(A and B) excitonic transitions are observed. By following the PL spectra as a function of temperature and excitation power, the main optical transitions in the Ga- and the misoriented N-face layers are found to be the same. Observed differences are related to the distinct creation of donor and acceptor states in the samples of different polarities. © 2000 American Institute of Physics.

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Kirilyuk, V., Zauner, A. R. A., Christianen, P. C. M., Weyher, J. L., Hageman, P. R., & Larsen, P. K. (2000). Exciton-related photoluminescence in homoepitaxial GaN of Ga and N polarities. Applied Physics Letters, 76(17), 2355–2357. https://doi.org/10.1063/1.126344

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