Noise in MEMS

140Citations
Citations of this article
228Readers
Mendeley users who have this article in their library.

Abstract

This review provides a comprehensive survey of noise research in MEMS. Some background on noise and on MEMS is provided. We review noise production mechanisms, and highlight work on the theory and modeling of noise in MEMS. Then noise measurements in the specific types of MEMS are reviewed. Inertial MEMS (accelerometers and angular rate sensors), pressure and acoustic sensors, optical MEMS, RF MEMS, surface acoustic wave devices, flow sensors, and chemical and biological MEMS, as well as data storage devices and magnetic MEMS, are reviewed. We indicate opportunities for additional experimental and computational research on noise in MEMS. © 2010 IOP Publishing Ltd.

Author supplied keywords

Cite

CITATION STYLE

APA

Mohd-Yasin, F., Nagel, D. J., & Korman, C. E. (2010). Noise in MEMS. Measurement Science and Technology, 21(1). https://doi.org/10.1088/0957-0233/21/1/012001

Register to see more suggestions

Mendeley helps you to discover research relevant for your work.

Already have an account?

Save time finding and organizing research with Mendeley

Sign up for free