Controlling morphology and aggregation in semiconducting polymers: The role of solvents on lasing emission in poly[2-methoxy-5-(20-ethylhexyloxy)- 1,4-phenylene-vinylene]

Abstract

Systematic experiments were performed to investigate solvent-dependent morphology and aggregation of the semiconducting polymer film poly[2-methoxy-5-(20-ethyl-hexyloxy)-1,4- phenylene-vinylene] (MEH-PPV), which was span-cast from nonaromatic strong polarity solvents tetrahydrofuran (THF), trichloromethane (TCM) and aromatic weak polarity solvents chlorobenzene (CB), toluene, and p-xylene. The results indicated that the conformation of the spin-cast MEH-PPV films with weak aggregation such as THF and TCM demonstrated excellent lasing emission performances because of inhibiting the fluorescence quenching induced by bi-molecule process. The Atomic Force Microscope (AFM) images confirmed the distinct morphologies of the spin-cast MEH-PPV films. The amplified spontaneous emission (ASE) was investigated in a simple asymmetric slab planar waveguide structure by methods of variable stripe length (VSL) and shifting excitation stripe (SES). The amplified spontaneous emission (ASE) experiments confirmed the distinct polymer chain conformation. The conformation, which preserved from the spin-cast process, indicated the distinct interactions between solvents and MEH-PPV polymer chains. The pure film spectra were performed to confirm the effect of distinct conformation on the material energy level. This work provides insights into the morphology and aggregation effect of the spin-cast polymer films on the performances of lasers.