Abstract
Picture perfect: Information about the local topologies of active sites on commercial nanoparticles can be gained with atomic resolution through spherical-aberration-corrected transmission electron microscopy (TEM). A powder of Pt nanoparticles on carbon black was examined with two advanced TEM techniques based on recent developments in hardware (aberration correction) and computation (exit wavefunction restoration). (Figure Presented). © 2007 Wiley-VCH Verlag GmbH & Co. KGaA.
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Gontard, L. C., Chang, L. Y., Hetherington, C. J. D., Kirkland, A. I., Ozkaya, D., & Dunin-Borkowski, R. E. (2007). Aberration-corrected imaging of active sites on industrial catalyst nanoparticles. Angewandte Chemie - International Edition, 46(20), 3683–3685. https://doi.org/10.1002/anie.200604811
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