A Miniaturized Biaxial Deformation Rig for in Situ Mechanical Testing

Abstract

A novel miniaturized biaxial deformation rig is presented. It allows one to apply in-plane biaxial stress states with arbitrary stress ratios and to perform strain path changes on thin-sheet metals. The device is optimized for in situ usage inside a scanning electron microscope and at synchrotron beam lines. The sample has a cruciform shape and the geometry is optimized with the aid of finite element simulations. A proof-of-principle experiment confirms the successful operation of this rig.