Journal ArticleOPEN ACCESS

Full-Scale Characterization of UVLED Al x Ga 1-x N Nanowires Via Advanced Electron Microscopy

  • Phillips P
  • Carnevale S
  • Kumar R
  • et al.
Microscopy and Microanalysis (2013) 19(S2) 1520-1521
DOI: 10.1017/s1431927613009598
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Abstract

Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

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APA

Phillips, P., Carnevale, S., Kumar, R., Myers, R., & Klie, R. F. (2013). Full-Scale Characterization of UVLED Al x Ga 1-x N Nanowires Via Advanced Electron Microscopy. Microscopy and Microanalysis, 19(S2), 1520–1521. https://doi.org/10.1017/s1431927613009598

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