Near-Field Imaging of Dielectric Components Using an Array of Microwave Sensors

Abstract

Microwave imaging is a high-resolution, noninvasive, and noncontact method for detecting hidden defects, cracks, and objects with applications for testing nonmetallic components such as printed circuit boards, biomedical diagnosis, aerospace components inspection, etc. In this paper, an array of microwave sensors designed based on complementary split ring resonators (CSRR) are used to evaluate the hidden features in dielectric media with applications in nondestructive testing and biomedical diagnosis. In this array, each element resonates at a different frequency in the range of 1 GHz to 10 GHz. Even though the operating frequencies are not that high, the acquisition of evanescent waves in extreme proximity to the imaged object and processing them using near-field holographic imaging allows for obtaining high-resolution images. The performance of the proposed method is demonstrated through simulation and experimental results.