Source size measurement options for low-emittance light sources

Abstract

Radiation-based techniques for measuring electron source sizes are widely used as emittance diagnostics at existing synchrotron sources. Three of these techniques, namely, pinhole imaging, double-slit interferometry, and a K-edge filter-based beam position and size monitor system (ps-BPM), are evaluated for measuring source sizes at low-emittance storage rings. Each technique is reviewed with a detailed system description, design optimization, and practical considerations targeted for small source sizes. Pinhole imaging has the simplest setup and gives the beam profile in both transverse dimensions but with limited resolution. Double-slit interferometry has the highest resolution but with a limited detectable size range. The ps-BPM system shows reasonable resolution for monitoring small source sizes and divergence and can give real-time information of the source position and angle. New facilities may consider an integrated system that combines some or all of these techniques.