Determination of Sn, Nb, and Ta in tin concentrates using wavelength dispersive X-ray fluorescence spectrometry

Abstract

An analytical methodology has been developed for the quantification of tin, niobium, and tantalum in tin concentrate samples using wavelength dispersive X-ray fluorescence spectrometry (WDXRFS). A series of synthetic standards were prepared by blending variable but precisely weighed quantities of Specpure® oxides of Sn, Nb, Ta, Fe, and Mn to obtain a mixture of SnO2 and stoichiometric composition of columbite-tantalite [(Fe0.8Mn0.2) (Nb, Ta)2O6]. The analytical data obtained by application of this method to tin concentrate samples were compared with those obtained by ICP-OES, and the experimental results are in good agreement.