A note on "a new approach for the selection of advanced manufacturing technologies: Data envelopment analysis with double frontiers"

Abstract

Recently, using the data envelopment analysis (DEA) with double frontiers approach, Wang and Chin (2009) proposed a new approach for the selection of advanced manufacturing technologies: DEA with double frontiers and a new measure for the selection of the best advanced manufacturing technologies (AMTs). In this note, we show that their proposed overall performance measure for the selection of the best AMT has an additional computational burden. Moreover, we propose a new measure for developing a complete ranking of AMTs. Numerical examples are examined using the proposed measure to show its simplicity and usefulness in the AMT selection and justification.