Guide to making XPS measurements on nanoparticles

  • Baer D
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Abstract

This guide briefly summarizes issues and considerations important for the use of x-ray photoelectron spectroscopy (XPS) for characterizing nanoparticles, which are important in many areas of science and technology. Because the surfaces play a major role in determining nanoparticle behaviors, XPS is an increasingly useful tool for understanding their properties, including addressing variations and nonreproducibility issues associated with these materials. The unusual physical and chemical behaviors of these particles must be considered in preparing and characterizing these materials. This guide is one of a series intended to highlight the best practices in the use of XPS.

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Baer, D. R. (2020). Guide to making XPS measurements on nanoparticles. Journal of Vacuum Science & Technology A, 38(3). https://doi.org/10.1116/1.5141419

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