Abstract
Large language models (LLMs) are emerging as powerful tools for hardware design, with recent work exploring their ability to generate register-transfer level (RTL) code directly from natural-language specifications. This paper presents a critical review and empirical evaluation of LLM-based RTL generation. We examine thirty-one published efforts, classifying their use of techniques such as fine-tuning, reinforcement learning, retrieval-augmented prompting, and multi-agent orchestration across eight methodological dimensions including debugging support, post-RTL metrics, and benchmark development. Building on this synthesis, we experimentally evaluate frontier commercial and open-weight models—GPT-4.1, GPT-4.1-mini, Claude Sonnet 4, and Llama 4 Maverick —on the VerilogEvalV2 and RTLLM-v2.0 benchmarks under both single-shot generation and a lightweight ReAct-style reflection loop, with compilation and simulation performed through Icarus Verilog interfaced via the Model Context Protocol (MCP). Results show that these models achieve up to 89.74% on VerilogEval and 96.08% on RTLLM, matching or exceeding prior domain-specific pipelines without specialized fine-tuning. Detailed failure analysis reveals systematic error modes, including FSM mis-sequencing, handshake drift, blocking vs. non-blocking misuse, and state-space oversimplification. Finally, we outline a forward-looking research roadmap toward natural-language-to-System-on-Chip (SoC) design, emphasizing realistic benchmarks and open flows, richer specification formalisms, AI-human collaborative design environments, and system-level feedback that spans physical design, firmware, and design space exploration. Together, this work provides a synthesis of recent advances and a baseline evaluation of frontier LLMs, highlighting opportunities and challenges in moving toward AI-native electronic design automation.
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Ravindran, A., Patra, A., Babaey, V., & Purini, S. (2026). A Critical Review and Evaluation of LLMs for RTL Generation. IEEE Access. Institute of Electrical and Electronics Engineers Inc. https://doi.org/10.1109/ACCESS.2026.3665894
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