Defect Recognition in Composite Materials Using Terahertz Spectral Imaging with ResNet18-SVM Approach

Abstract

Multilayer composite materials often develop internal defects at varying depths due to manufacturing and environmental factors. Traditional planar scanning methods lack the ability to pinpoint defect locations in depth. This study proposes a terahertz time-domain spectroscopy (THz-TDS)-based defect detection method using continuous wavelet transform (CWT) to convert spectral signals into time-frequency images. These are analyzed by the ResNet18 model combined with a support vector machine (SVM) classifier. Comparative experiments with four classical deep learning models and three classifiers show that the Residual Network with 18 layers (ResNet18-SVM) approach achieves the highest accuracy of 98.56%, effectively identifying three types of defects. The results demonstrate the method’s strong feature extraction, depth resolution, and its potential for nondestructive evaluation of multilayer structures.