ARM based Telemetry Subsystems Qualification for Micro-Satellite

Abstract

Developing spacecraft telemetry subsystem utilizing commercial of the shelf (COTs) components to meet the technical design requirements with low-cost is big challenge for designers, due to the considerations of harmed ionizing space radiation effect, specially the total ionizing dose effect (TID). This effect induces performance degradation and failure in satellite electronic components (ECs). Because of the complexity of microcontrollers and their various integrated functionality, they present a hardness assurance encounter. A careful technique was followed in analyzing the space radiation effects. Then rigorous tests should be conducted to test the performance of the candidate microcontrollers under these effects. This paper presents the predicted dose depth curve and the total ionizing does test results for a commercial ARM microcontroller for Low Earth Orbit (LEO) satellites. Such test results help estimate the effect of space environment on the microcontroller and decide if such microcontroller is an accepted candidate for LEO missions or not.