Evidence for multi-atom resonance X-ray raman spectroscopy-an in situ low Z-element and bond-specific X-ray spectroscopy

Abstract

We have shown a possibility of multi-atom resonant X-ray Raman (MARX-Raman) spectroscopy by measuring the N K-edge loss spectrum of TaN at Ta L3-edge and C K-edge loss spectrum of Er(C5H5)3 at Er L1-edge. When the excitation X-ray energy was tuned to the Ta L3-edge and inelastic scattering spectra were recorded around 400 eV loss corresponding to the N K-edge Raman region, we found a clear enhancement of emission spectrum. The same enhancement was observed in C K-edge Raman region in Er(C5H5)3. These experimental results have indicated the possibility of MARX-Raman phenomenon which may lead to a new in situ and bond-specific XAFS spectroscopy for low Z elements.