A simple experimental procedure to quantify image noise in the context of strain measurements at the microscale using DIC and SEM images

Abstract

Image noise is an important factor that ino, uences the accuracy of strain field measurements by means of digital image correlation and scanning electron microscope (SEM) imaging. We propose a new model to quantify the SEM image noise, which extends the classical photon noise model by taking into account the brightness setup in SEM imaging. Furthermore, we apply this model to investigate the impact of dio, erent SEM setting parameters on image noise, such as detector, dwell time, spot size, and pressure in the SEM chamber in the context of low vacuum imaging.