Abstract
A one-step process for copper nanopatterning on a silicon surface is reported. The patterns were formed by selective copper electroless deposition from a diluted HF/Cu 2+ solution on defect sites on the silicon surfaces introduced by nanomechanical scratching. Field emission scanning electron microscopy and energy dispersive X-ray spectroscopy analyses show that copper particles were deposited preferentially on well-defined defect sites with high selectivity. The experiment demonstrated here shows a new one-step approach for metallic nanopatterning formation on a silicon surface.
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CITATION STYLE
Choi, J., Chen, Z., & Singh, R. K. (2003). A Method for Selective Deposition of Copper Nanoparticles on Silicon Surfaces. Journal of The Electrochemical Society, 150(8), C563. https://doi.org/10.1149/1.1592520
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