Uniform luminescence at breakdown in 4H-SiC 4°-Off (0001) p-n diodes terminated with an asymmetrically spaced floating-field ring

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Abstract

Conventional floating-field rings, which are used to reduce the peak electric field at the periphery of power devices, cause nonuniform avalanche multiplication when applied to planar junctions formed on 4H-SiC substrates misoriented from (0001) toward [1120]. Accordingly, a novel asymmetrically spaced floating-field ring (AS-FFR) was applied to 4H-SiC 4°-off (0001) p-n diodes and found to be effective against such nonuniform avalanche multiplication; that is, luminescence at breakdown was nearly uniform when the spacing between the edge of the anode and the inner edge of the AS-FFR was 2.0μm in the [1120] direction and 1.5μm in the [1120] direction. This result should contribute to exploring the possibility of 4H-SiC power devices with higher avalanche ruggedness.

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Mochizuki, K., Kameshiro, N., Matsushima, H., Okino, H., & Yamada, R. (2015). Uniform luminescence at breakdown in 4H-SiC 4°-Off (0001) p-n diodes terminated with an asymmetrically spaced floating-field ring. IEEE Journal of the Electron Devices Society, 3(4), 349–354. https://doi.org/10.1109/JEDS.2015.2428993

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