Modelling the spectral reflectances of miscellaneous ITO coatings by using only the Drude theory

Abstract

The spectral reflectances of miscellaneous TCO coatings were measured and analyzed with the Drude theory in the NIR region. The Drude model is a classical model and can be used to describe the dielectric behavior of metals and semiconductors quite well at wavelengths exceeding the plasma edge. Two types of sol-gel processed tin doped indium oxide (ITO) films deposited by dip-coating technique and a commercial sputtered ITO film were measured. The data for the optical and electrical parameters obtained from the modelling of the measured reflectance are in good agreement with those found in literature. © Published under licence by IOP Publishing Ltd.