Identification of the carbon antisite-vacancy pair in 4H-SiC

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Abstract

The metastability of vacancies was theoretically predicted for several compound semiconductors alongside their transformation into the antisite-vacancy pair counterpart; however, no experiment to date has unambiguously confirmed the existence of antisite-vacancy pairs. Using electron paramagnetic resonance and first principles calculations we identify the SI5 center as the carbon antisite-vacancy pair in the negative charge state (CSiVC-) in 4H-SiC. We suggest that this defect is a strong carrier-compensating center in n-type or high-purity semi-insulating SiC. © 2006 The American Physical Society.

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Umeda, T., Son, N. T., Isoya, J., Janzén, E., Ohshima, T., Morishita, N., … Bockstedte, M. (2006). Identification of the carbon antisite-vacancy pair in 4H-SiC. Physical Review Letters, 96(14). https://doi.org/10.1103/PhysRevLett.96.145501

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