Abstract
Photovoltaic (PV) systems are increasingly integral to global energy solutions, but their long-term reliability is challenged by various operational faults. In this article, we propose an advanced hybrid diagnostic framework combining a Deep Belief Network (DBN) for feature pattern extraction and a Light Gradient Boosting Machine (LightGBM) for classification to detect and diagnose PV panel faults. The proposed model is trained and validated on the QASP PV Fault Detection Dataset, a real-time SCADA-based dataset collected from 255 W panels at the Quaid-e-Azam Solar 100 MW Power Plant (QASP), Pakistan’s largest solar facility. The dataset encompasses seven classes: Healthy, Open Circuit, Photovoltaic Ground (PVG), Partial Shading, Busbar, Soiling, and Hotspot Faults. The DBN captures complex non-linear relationships in SCADA parameters such as DC voltage, DC current, irradiance, inverter power, module temperature, and performance ratio, while LightGBM ensures high accuracy in classifying fault types. The proposed model is trained and evaluated on a real-world SCADA-based dataset comprising 139,295 samples, with a 70:30 split for training and testing, ensuring robust generalization across diverse PV fault conditions. Experimental results demonstrate the robustness and generalization capabilities of the proposed hybrid (DBN–LightGBM) model, outperforming conventional machine learning methods and showing an accuracy of 98.21% classification accuracy, 98.0% macro-F1 score, and significantly reduced training time compared to Transformer and CNN-LSTM baselines. This study contributes to a reliable and scalable AI-driven solution for real-time PV fault monitoring, offering practical implications for large-scale solar plant maintenance and operational efficiency.
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CITATION STYLE
Kull, K., Khan, M. A., Asad, B., Naseer, M. U., Kallaste, A., & Vaimann, T. (2025). Adaptive Deep Belief Networks and LightGBM-Based Hybrid Fault Diagnostics for SCADA-Managed PV Systems: A Real-World Case Study. Electronics (Switzerland), 14(18). https://doi.org/10.3390/electronics14183649
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