Abstract
An ultralow resistance-area (RA) product of 0.4 (μm)2 was achieved in CoFeBMgOCoFeB magnetic tunnel junctions with a high magnetoresistance ratio of 57% at room temperature. Various growth conditions for polycrystalline MgO(001) tunneling barrier were optimized to improve the crystalline orientation of the MgO(001) layer, which resulted in a significant enhancement of magnetoresistance in an ultralow RA region below 1 (μm)2. Removal of residual H2 O molecules from a growth chamber was especially effective in improving the crystalline orientation. The present achievements will enable the development of highly sensitive read heads for ultrahigh-density hard disk drives. © 2006 American Institute of Physics.
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CITATION STYLE
Nagamine, Y., Maehara, H., Tsunekawa, K., Djayaprawira, D. D., Watanabe, N., Yuasa, S., & Ando, K. (2006). Ultralow resistance-area product of 0.4 Ω (μm)2 and high magnetoresistance above 50% in CoFe/B/MgO/CoFeB magnetic tunnel junctions. Applied Physics Letters, 89(16). https://doi.org/10.1063/1.2352046
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