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A High-Speed Electron-Counting Direct Detection Camera for TEM

  • Mooney P
  • Contarato D
  • Denes P
  • et al.
Microscopy and Microanalysis (2011) 17(S2) 1004-1005
DOI: 10.1017/s1431927611005897
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Abstract

Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

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Mooney, P., Contarato, D., Denes, P., Gubbens, A., Lee, B., Lent, M., & Agard, D. (2011). A High-Speed Electron-Counting Direct Detection Camera for TEM. Microscopy and Microanalysis, 17(S2), 1004–1005. https://doi.org/10.1017/s1431927611005897

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