High-resolution hard-X-ray fluorescence spectrometer

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Abstract

A Johann-type X-ray fluorescence spectrometer for XES, RXES/RIXS, HERFD XAS and RXS experiments was designed, constructed and commissioned at the X10DA-SuperXAS beamline of the Swiss Light Source. The spectrometer consists of three key elements: a sample manipulator, an X-ray dispersive element (spherically bent silicon or germanium crystal), and an one-dimensional-array X-ray detector. The detected X-ray fluorescence energy is scanned by changing the angle between the sample, crystal and detector. The energy resolution of the spectrometer ranges from sub-eV to several eV. Thanks to the use of a one-dimensional array detector the spectrometer is easy to align and operate. © 2009 IOP Publishing Ltd.

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Kleimenov, E., Bergamaschi, A., Bokhoven, J. V., Janousch, M., Schmitt, B., & Nachtegaal, M. (2009). High-resolution hard-X-ray fluorescence spectrometer. In Journal of Physics: Conference Series (Vol. 190). Institute of Physics Publishing. https://doi.org/10.1088/1742-6596/190/1/012035

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