High frequency investigation of graded gap injectors for GaAs Gunn diodes

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Abstract

In this work, we present a detailed high frequency characterization of conventional and optimized Gunn-diodes containing a graded gap injector. It is shown that the Al-concentration in the hot electron injector influences the occupation of the Γ- and L-valleys and hence the electron drift velocity in the active Gunn layer. Quantitative values for the occupation of the L-valley can be extracted from the S-parameter measurements. © 2004 Elsevier Ltd. All rights reserved.

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Montanari, S., Förster, A., Lepsa, M. I., & Lüth, H. (2005). High frequency investigation of graded gap injectors for GaAs Gunn diodes. Solid-State Electronics, 49(2), 245–250. https://doi.org/10.1016/j.sse.2004.08.014

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